Chun received her BS degree in chemistry from Nanjing University, China, in 2013. She’s now a graduate student at the Department of Chemistry, University of Chicago.
Chun is working on self-assembly of cylinder-forming PS-b-PMMA films. Although perpendicularly oriented PS-b-PMMA cylinders can be obtained by using random copolymer brushes, these cylinders are not perfectly perpendicular to substrates according to simulation results. By molecular transfer printing (MTP), she fabricates hexagonal chemical patterns without requiring advanced lithography tools by replicating the surface domain patterns of self-assembly of cylinder-forming PS-b-PMMA films. In addition, she is researching whether the replica has less defect structures using X-ray scattering experiments.
Ultrathin initiated chemical vapor deposition polymer interfacial energy control for directed self-assembly hole-shrink applications
Dolejsi, Moshe, et al. "Ultrathin initiated chemical vapor deposition polymer interfacial energy control for directed self-assembly hole-shrink applications." Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena 37.6 (2019): 061804.
Li, Xiao, et al. "Sculpted grain boundaries in soft crystals." Science Advances 5.11 (2019): eaax9112.
Zhou, Chun, et al. "Studying the effects of chemistry and geometry on DSA hole-shrink process in three-dimensions." Journal of Micro/Nanolithography, MEMS, and MOEMS 17.3 (2018): 031203.
Derivation of multiple covarying material and process parameters using physics-based modeling of X-ray data
Khaira, Gurdaman, et al. "Derivation of multiple covarying material and process parameters using physics-based modeling of X-ray data." Macromolecules 50.19 (2017): 7783-7793.
Derivation of Multiple Covarying Material and Process Parameters Using Physics-Based Modeling of X-ray Data
Gurdaman Khaira, Manolis Doxastakis, Alec Bowen, Jiaxing Ren, Hyo Seon Suh, Tamar Segal-Peretz, Xuanxuan Chen, Chun Zhou, Adam F. Hannon, Nicola J. Ferrier, Venkatram Vishwanath, Daniel F. Sunday, Roel Gronheid, R. Joseph Kline, Juan J. de Pablo, Paul F. Nealey. Multiple Covarying Material and Process Parameters Using Physics-Based Modeling of X-ray Data. Macromolecules. 7793. Vol. 50, Pg. 7783.