Probing Diffuse Polymer Brush Interfaces Using Resonant Soft X-ray Scattering
De Hoe, Guilhem X., Jun Mao, Zhang Jiang, Seth B. Darling, Matthew V. Tirrell, and Wei Chen. "Probing Diffuse Polymer Brush Interfaces Using Resonant Soft X-ray Scattering." Synchrotron Radiation News 33, no. 4 (2020): 24-30.
CASE
Seth B. Darling
Senior scientist and director of the Argonne Center for Molecular Engineering;
UChicago CASE senior scientist- Websites: Argonne Lab Profile
- Contact: darling@anl.gov